Dual element angled beam LFI/SCR20

Dual element angled beam LFI/SCR20

Dual element angled beam probes for the inspection of low thickness material or for the detection of near defects

IMG LFI / SCR 20 series includes dual crystal probes in two configurations, designed for applications such as weld inspection on thin austenitic materials and crack detection in thin sections. Both models are available with frequencies ranging from 1 to 4 MHz and feature dedicated geometries and crystals to ensure a setup consistent with the required inspection.

Examples of use:

  • Weld inspection on thin austenitic materials
  • Crack inspection on thin sections
  • Crystal dimension: 7 × 10
  • Available angles: 45° / 60° / 70°
  • Standard focal lengths: 20 mm / 15 mm / 10 mm
  • Crystal dimension: 6 × 10
  • Focal: 8 mm
Both models: from 1 to 4 MHz
  • Available upon request: different angles and focal lengths
  • Probes can be made of piezocomposite crystal

The following are included with each probe:

  • Characterization Certificate
  • Technical sheet
    Upon request:
  • Fire and angle diagram

ISO 22232-2 certification upon request