IMG LFI / SCR 25 series includes dual crystal probes in two configurations (LFI and SCR), designed for inspections requiring precision at thin thicknesses and defects near the inspected area. This solution is used, for example, to inspect welds on thin austenitic materials and to detect cracks in thin sections.
Both models are available with frequencies ranging from 1 to 4 MHz and can be configured with standard angles and focal lengths or, upon request, with custom specifications.