Dual element straight beam
IMG dual element probes (dual crystal UT transducers) are designed for applications where it is necessary to detect and identify disconinuities close to the inspection surface. They are widely used for corrosion testing and, in combination with single element probes, when the inspection can be performed from a single surface.
Available in standard versions or customized according to specific control requirements.
Examples of use:
- Search for defects in low thicknesses or close to the examination surface
- Thickness measurements and corrosion inspection









