Dual Element Angled Beam LFI/SCR40
IMG LFI / SCR 40 series is a complete range of dual crystal probes in LFI and SCR configurations, developed for applications such as weld inspection on thick austenitic materials.
Both models are available with frequencies ranging from 1 to 4 MHz and with standard angle and focal length combinations; different configurations are available upon request to meet specific inspection requirements.
Examples of use:
- Weld inspection on thick austenitic materials












