Dual element angled beam DAL/DAT

Dual element angled beam DAL/DAT

Dual element angled beam probes for the inspection of low thickness material or for the detection of near defects

IMG dual element angled probes are dual crystal UT transducers available in two versions:DAL (Longitudinal waves) and DAT (Transverse waves). They are designed for applications where it is necessary to inspect thin sections or detect nearby defects (close to the inspected area), eliminating the dead zone.
The DAL and DAT models can be supplied with a standard focal length (as shown in the table) or with a customer-specified depth of focus.

Examples of use:

  • Weld inspection on thin austenitic materials
  • Crack inspection on thin sections
  • Elimination of the dead zone
  • DAL: double crystal angled longitudinal wave probes
  • DAT: double crystal angled transverse wave probes
  • Supplied with standard focal length (as shown in the table)
  • Or with a beam depth of focus specified by the customer

Custom probes can be manufactured upon request in:

  • crystal
  • external dimensions
  • frequency
  • damping

ISO 22232-2 certification upon request

  • We can manufacture probes with crystals, external dimensions, frequency, and damping tailored to the customer's specifications