Description:
Dual element angled beam probes with Longitudinal waves (DAL) or with Transverse waves (DAT) are suitable for the inspection of low thickness material or for the detection of near defects. Supplied with a standard focus point, as per the above chart. However, it is possible request a specific beam focusing depth. Each probe comes with a certificate of characterization (FFT) and upon request a technical data sheet. Upon request, it is possible to manufacture probes with crystal, housing, frequency and damping according customer requirements
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