{"id":16824,"date":"2025-12-17T11:03:50","date_gmt":"2025-12-17T10:03:50","guid":{"rendered":"http:\/\/staging.secchiemoschino.it\/prodotti\/dual-element-angled-beam-lfi-scr-25\/"},"modified":"2026-06-25T11:32:22","modified_gmt":"2026-06-25T09:32:22","slug":"dual-element-angled-beam-lfi-scr-25","status":"publish","type":"prodotti","link":"https:\/\/img-us.com\/en\/products\/dual-element-angled-beam-lfi-scr-25\/","title":{"rendered":"Dual element angled beam LFI \/ SCR 25"},"content":{"rendered":"
Dual element angled beam LFI \/ SCR 25<\/div><\/div>
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Dual element angled beam LFI \/ SCR 25<\/h1><\/div>
Dual element angled beam probes for the inspection of low thickness material or for the detection of near defects<\/div><\/div>

IMG LFI \/ SCR 25 series includes dual crystal probes in two configurations (LFI and SCR), designed for inspections requiring precision at thin thicknesses and defects near the inspected area. This solution is used, for example, to inspect welds on thin austenitic materials and to detect cracks in thin sections.
\nBoth models are available with frequencies ranging from 1 to 4 MHz and can be configured with standard angles and focal lengths or, upon request, with custom specifications.<\/p>\n<\/div>

Examples of use:<\/p>\n<\/div>