{"id":16820,"date":"2025-12-12T17:25:06","date_gmt":"2025-12-12T16:25:06","guid":{"rendered":"http:\/\/staging.secchiemoschino.it\/prodotti\/dual-element-angled-beam-lfi-scr20\/"},"modified":"2026-06-25T11:29:25","modified_gmt":"2026-06-25T09:29:25","slug":"dual-element-angled-beam-lfi-scr20","status":"publish","type":"prodotti","link":"https:\/\/img-us.com\/en\/products\/dual-element-angled-beam-lfi-scr20\/","title":{"rendered":"Dual element angled beam LFI\/SCR20"},"content":{"rendered":"
Dual element angled beam LFI\/SCR20<\/div><\/div>
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Dual element angled beam LFI\/SCR20<\/h1><\/div>
Dual element angled beam probes for the inspection of low thickness material or for the detection of near defects<\/div><\/div>

IMG LFI \/ SCR 20 series includes dual crystal probes in two configurations, designed for applications such as weld inspection on thin austenitic materials and crack detection in thin sections. Both models are available with frequencies ranging from 1 to 4 MHz and feature dedicated geometries and crystals to ensure a setup consistent with the required inspection.<\/p>\n<\/div>

Examples of use:<\/p>\n<\/div>